DataPhysics SPA 25 measuring system for surface topography and roughness parameters
Resource type:
Brochure
Format:
pdf
Date of creation:
2 January 2024
Library code:
13584
High resolution measuring technique
The DataPhysics surface profile analyzer SPA 25 can measure surface topography and roughness parameters with exceptional speed and resolution.
The SPA 25 utilises the white-light interferometry technique that features a height resolution of down to 0.1 nm even with small magnification factors. This gives the SPA 25 a significant advantage over rivalling systems that use other techniques like focus variation or confocal microscopy.
