Multiple components analysis by PCA mapping with an IR microscope

Mapping measurement with an IR microscope formally had problems such as difficult sampling and long measurement time. Now, the sample can be treated easily for example by using a tool like SliceMaster and the measurement time can be shortened to less than 1/10 by using a multi-element detector as compared with the traditional mapping system. However, although the mapping measurement itself became easier, much more time is needed for data analysis due to tremendous data points.

This report shows some examples of analysis by PCA mapping which enables easier analysis of component distribution from mapping data.