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Estimation of refractive index of monocrystalline sapphire by polarization measurement using MSV-5000 series microscopic spectrophotometer

Resource type: 
Application note
Author(s): 
Jasco
Format: 
pdf
Date of creation: 
30 January 2017
Library code: 
10744

The MSV-5000 series microscopic spectrophotometer is for transmission and reflection measurements of a sample as small as 10 um in a wide wavelength range from ultraviolet to near-infrared. The MSV-5000 has a built-in the Glan-Taylor polarizer as standard and can obtain optical constant such as refractive index(n) and extinction coefficient(k) by measuring reflectance spectrum of small monocrystalline having birefringence.

This time, the monocrystalline sapphire(measurement area size: 50 um in diameter), which has two types of crystal axis (c-axis or a-axis) and whose refractive index is already known, was measured and the dispersion of the refractive index was calculated.