PIKE Technologies specular reflectance sampling accessories for FTIR
Resource type:
Catalog extract
Format:
pdf
Date of creation:
9 May 2017
Library code:
10874
Specular reflectance sampling represents a very important technique useful for the measurement of thin films on reflective substrates, the analysis of bulk materials and the measurement of mono-molecular layers on a substrate material. Often this technique provides a means of sample analysis with no sample preparation – keeping the sample intact for subsequent measurements.
